Artech House Publishers Wafer-level testing and test during burn-in for integrated circuits. unabridged ed, hardback/krishnendu chakrabarty
Artech House Publishers

Artech House Publishers Wafer-level testing and test during burn-in for integrated circuits. unabridged ed, hardback/krishnendu chakrabarty

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Publisher: Artech House Publishers Author(s): Krishnendu Chakrabarty Number of pages: 210 Publication date: 2010 Dimensions: 164 x 235 x 18 Cover type: Hardback Redescopera farmecul lecturii si alege-ti de pe elefant.

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Informatii produs

PublisherArtech
Author(s)Krishnendu
Number of pages210
Publication date2010
Dimensions164 x 235 x 18
Cover typeHardback
Intre timp, pentru mai multe detalii, ne poti scrie la adresa de emailContactelefantro

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Branduri technology, engineering, agriculture

Artech House Publishers Wafer-level testing and test during burn-in for integrated circuits. unabridged ed, hardback/krishnendu chakrabarty

Artech House Publishers Wafer-level testing and test during burn-in for integrated circuits. unabridged ed, hardback/krishnendu chakrabarty

870.99 Lei